Doyan A, Susilawati S, Muliyadi L. Analysis of the Energy Band Gap of Tin Oxide Thin Layers as Semiconductor Base Materials in Electronic Devices. jppipa, pendidikan ipa, fisika, biologi, kimia [Internet]. 2022 Dec. 28 [cited 2024 Jul. 3];8(6):2772-7. Available from: https://jppipa.unram.ac.id/index.php/jppipa/article/view/2657